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Articles shown here have been peer-reviewed and accepted, which are not yet assigned to volumes /issues, but are citable by Digital Object Identifier (DOI).
Investigation of TIS effect in the E-beam overlay measurement
ZHANG Yu, BIAN Yuyang
DOI: 10.3724/jfmd.2505029
Abstract PDF
Research progress of chip-scale atomic vapor cells for atomic sensors
HOU Jianwei, ZANG Faheng, LI Dezhao, LI Tie, GUO Xiaojun, YANG Zhuoqing
DOI: 10.3724/jfmd.2503004
Abstract PDF