Si(100)-(2×1)表面上Si薄膜生长的模拟

Simulation of Si film growth on Si(100)-(2×1) surface

  • 摘要: 本文在分析表面扩散各向异性、二聚体和二聚体列影响的基础上,建立了Si(100)-(2×1)表面上Si薄膜生长的K inetic Monte Carlo(KMC)模型,利用该模型对薄膜生长的初始阶段进行了研究。结果表明:吸附原子的扩散距离随温度的变化满足指数函数L=L0AeT/C。在一定的入射率下存在一最佳成岛温度,该温度随入射率的增大而升高。随入射率的减小,薄膜逐渐从离散生长向紧致生长转变,表面扩散的各向异性越显著。

     

    Abstract: Based on the analysis of the effect of diffusional anisotropy,dimer and dimer row,a kinetic Monte Carlo(KMC) model was developed to investigate the intial stage of homoepitaxy on Si(100)-(2×1) surface.The results showed that the diffusion distance follows an exponential temperature dependence,i.e.L=L0AeT/C.There is an optimum islanding temperature at a given deposition rate and this temperature increases with increasing deposition rate.The film growth changes from disperse mode to compact mode and the diffusional anisotropy is more distinct with the decrease of deposition rate.

     

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