不同组分PZT压电薄膜的性能

Properties of PZT thin films with different compositions

  • 摘要: 采用sol-gel工艺在Pt/Ti/SiO2/Si衬底上制备了不同条件的锆钛酸铅(PZT)薄膜。分析了不同的前烘温度、不同锆钛比例对PZT薄膜的微观结构和电特性所产生的影响。SEM分析结果显示,铁电薄膜的晶化较完善,薄膜表面均匀致密。用X射线衍射分析了不同条件制备的PZT薄膜,表明薄膜的微观结构和取向不仅对热处理的条件非常敏感,而且也深受薄膜组分的影响。铁电测试表明对PZT(锆/钛=30/70),300℃热处理的薄膜具有最大的自发极化值。而对于不同锆钛比的薄膜,在准同型相界附近的53/47配比的PZT薄膜表现出最好的铁电性、介电性和最高的体电阻率。

     

    Abstract: Lead zirconate titanate(PZT)films with different compositions and pyrolysis temperature were fabricated on Pt(111)/Ti/SiO2/Si using sol-gel method.The effects of compositions and pyrolysis temperature on the microstructure,preferential orientation and electrical properties of PZT films were investigated.The SEM photographs reveal that all the PZT films are well-crystallized and have dense and uniform microstructure without any cracks.The XRD analysis indicates that the preferential orientation is not only sensitive to the pyrolysis temperature,but also to the compositions.The PZT(Zr:Ti = 30/70)pyrolyzed at 300℃ presents a high remanent polarization of 17.32μC/cm2 and coercive field of 23.3kV/cm.For the PZT films with different compositions,PZT(53/47)shows the highest remanent polarization,dielectric constant and resistivity.

     

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