氢和硼离子轰击可消除(001)面多晶金刚石膜的空位缺陷

Vacancy defects of (001) polycrystalline diamond films eliminated by hydrogen and boron ions bombardment

  • 摘要: 在微波等离子体化学气相沉积金刚石膜时,采用负偏压使氢和硼离子轰击金刚石膜表面。发现单纯的氢离子的轰击会导致表面刻蚀,可使(001)面颗粒尺寸增大。用扫描电镜(SEM)和阴极发射光谱(CL)分析了硼离子掺杂后001取向的金刚石膜表面,发现CL中A峰消失,表明薄膜中位错密度降低。首次发现CL谱中741.5 nm峰和575 nm到625 nm宽峰明显下降,表明在金刚石膜中,中性空位和氮空位缺陷基本消失,利用小原子穿透理论解释了这个现象。

     

    Abstract: The hydrogen and boron ion bombardments were performed by applying a negative bias voltage to the substrate during microwave plasma chemical vapor deposition process. The size of (001) faces increased after hydrogen ions etching while other grains were etched off by using only hydrogen as reactant gas. The 001-oriented films after boron doping were investigated by scanning electron microscopy (SEM) and cathodoluminescent (CL) spectra. The absence of the band-A emission in the CL spectra means a low density of dislocation in the films. It is the first time to indicate that the peak at 741.5 nm and the broad peak at around 575 nm and 625 nm in the CL spectra are reduced efficiently after boron doping in (001) polycrystalline diamond films. These phenomena should be explained in simple terms with a penetrating or being adsorbed by the lattice nets of 001-oriented film model.

     

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