溅射功率和靶基距对ZAO薄膜性能影响

Sputtering power and Target-Substrate Distance dependence on the properties of ZAO thin films

  • 摘要: 采用直流反应磁控溅射技术,制备获得ZnO:Al(ZAO)薄膜,研究溅射功率、靶基距关键制备工艺参数对ZAO薄膜的组织结构、光、电性能的影响,并获得了最佳的溅射功率、靶基距制备参数,利用该参数制备ZAO薄膜,能够获得在可见光范围内的平均透射率》80%,最低电阻率为4.5×10-4Ω·cm的ZAO薄膜,其光电性能均满足应用需求。

     

    Abstract: ZnO:Al(ZAO)thin film was prepared by DC reactive magnetron sputtering.Sputtering power and Target-Substrate Distance(TSD) is the key process parameters.In this paper,the influences of sputtering power and TSD on resistivity,transparency and microstructure were investigated.The optimal prepared parameters about sputtering power,TSD was obtained.The high performance ZAO film with resistivity of 4.5×10-4Ω·cm and average optical transmittance over 80%within visible light,was successfully achieved using the optimal parameters.The optical and electric properties are to meet the application requirements.

     

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