气态源分子束外延生长重碳掺杂p型InGaAs研究

Study on ultrahigh carbon-doped p-t ype InGaAs grown by gas source molecular beam epitaxy

  • 摘要: 采用气态源分子束外延(GSMBE)技术,以四溴化碳(CBr4)作为碳杂质源,系统研究了InP衬底上碳掺杂p型InGaAs材料的外延生长及其特性,在AsH3压力5.33×104Pa,生长温度500℃条件下获得了空穴浓度高达1×1020/cm3、室温迁移率为45cm2/Vs的重碳掺杂p型In0.53Ga0.47As材料。研究了CBr4和AsH3束流强度以及生长温度等生长条件对碳掺杂InGaAs外延层组份、空穴浓度和迁移率的影响,并对不同生长条件下的氢钝化效应进行了分析。

     

    Abstract: The growth and characteristics of carbon-doped p-type InGaAs lattice matched to InP by gas source molecular beam epitaxy(GSMBE)werestudied,using carbon tetrabro mide(CBr4)as a doping source.Under AsH3 supply pressure 5.33×104 Pa and growth temperature 500℃,ultr ahigh carbon-doped p-type InGaAs epi-lay er with hole concentration of 1×1020/cm3 and room tempera-ture mobility of 45cm2/Vs are achieved.The effects of CBr4 supply pressure,AsH3 supply pressure and growth temperature on the composition,hole concentration and mobility of carbon-doped InGaAs epi-layers were investigated.The d ependence of hydrogen passivation e ffect on the growth condition was also studied.

     

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