电子束蒸发沉积制备高度晶体取向的CeO2薄膜

Fabrication of highly orientated CeO2 thin film by electron beam evaporation deposition

  • 摘要: 为了得到CeO2为埋层的新型SOI(SiliconOnInsulator)材料,采用电子束蒸发沉积及后期退火处理的方法制备得到了高度(111)、(311)晶体取向的CeO2薄膜,为进一步外延制备SOI材料打下了良好的基础。同时,从热力学角度就退火对CeO2薄膜晶体取向的影响机理进行了初步的探讨。由于CeO2(111)、(311)面为密排面和次密排面,在结晶化过程中所需克服的能垒最低和次低,所以,退火后形成了(111)、(311)结构的CeO2薄膜。

     

    Abstract: To obtain novel SOI (Silicon On Insulator)with buried CeO2,the electron evaporated depo-sition and the post annealing were used.And high orientated(111),(311)CeO2 film was obtained.The film provides the substrate for the following silicon epitaxy.The me chanism of high orientation induced by the post annealing is disc ussed.The(111),(311)crystal planes are the close-packed and next-close-packed crystal plan e respectively,they only need the lo west energy to conquer the energy barrier when the CeO2 thin film is crystallized.Thus the annealing induces the formation of(111),(311)CeO2 thin film.

     

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