Abstract:
Changes in the GaN growth surface morphology and material quality by the addition of H
2 into the N
2 carrier gas during HVPE are reported. Hydrogen in the growth ambient leads to materials with a narrow bandedge emission photoluminescence (PL) and a decreased linewidth of (0002) symmetric and (1014) asymmetric X ray diffraction rocking curves. The change of the GaN growth by H
2 addition has been ascribed to a reduction in the NH
3 gas phase reactions in the presence of H
2, leading to a lower N activity at the surface. The lower N activity would then lead to an enhanced surface diffusion of Ga adatoms and these subsequently changes in material properties and structures.