硫化温度对CuInS2吸收层薄膜微结构的影响

Effects of sulflurization temperature on the microstructures of CuInS2 absorber films

  • 摘要: 采用电沉积-硫化法制备了CuInS2(CIS)薄膜。用X射线衍射仪(XRD)、原子力显微镜(AFM)和能谱仪(EDS)等实验手段对CIS薄膜的晶体结构、形貌和组分进行了表征。结果表明:在500~560℃硫化温度范围内制备的CIS薄膜表面均生成金属性CuxS二元相,后续的KCN刻蚀处理CuxS二元相可去除。硫化温度为540℃制得的CIS薄膜高质量结晶、具有112择优取向,适合于制备CIS薄膜太阳能电池吸收层。

     

    Abstract: CuInS2(CIS) films were prepared by sulfurization of the electrodepositing Cu-In precursors in sulfur atmosphere.The crystal structure,surface morphologies and compositions of the CuInS2 films were characterized by X-ray diffraction(XRD),atomic force microscopy(AFM) and energy dispersive spectroscopy(EDS) respectively.The results revealed that the metallic CuxS phase always presented on top of the CIS films in the range of 500~560℃ sulfurization temperatures,which could be removed by KCN etching.The high quality CIS films with the preferred orientation obtained for the sulfurization at 540℃ are favorable for CuInS2 absorbers in solar cells.

     

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