δ-掺杂GaAs/AlxGa1-xAs二维电子气结构材料的GSMBE生长与特性

THE GROWTH AND CHARACTERIZATION OF δ-DOPED GaAs/AlGaAsTWO DIMENSIONAL ELECTBON GAS MATERIALS BY GSMBE

  • 摘要: 本文用GSMBE技术生长纯度GaAs和δ-掺杂GaAs/AlxGa1-xAs结构二维电子气材料并对其电学性能进行了研究。对于纯度GaAs的GSMBE生长和研究,在低掺Si时,载流子浓度为2×1014cm-3,77K时的迁移率可达84,000cm2/V.s。对于用GSMBE技术生长的δ-掺杂GaAs/AlxGa1-xAs二维电子气材料,在优化了材料结构和生长工艺后,得到了液氮温度和6K迁移率分别为173, 583cm2/V.5和7.67×105cm2/V.s的高质量GaAs/AlxGa1-xAs二维电子气材料。

     

    Abstract: In this paper pure GaAs and δ-doped GaAs/AlGaAs two dimensional electron gas materials and their electrical properties were studied by GSMBE and Hall measurement. Pure GaAs materials were grown and measured at first. With slightly Si doping, the electron concentration of GaAs was 2 × 1014cm-3 with 77K mobility of 84,000cm-2/V.s. δ-doped GaAs/AlGaAs two dimensional electron gas was then investigated, and high quality materials were obtained with 77K and 6K mobilities of 174,583 cm-2/V.s and 7.67 × 10-5cm-2/V.s, respectively after the optimization of material structure and growth condition.

     

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