一种提高硅集成电感Q值的方法

A method for improving quality factor (Q) of integrated inductor on silicon

  • 摘要: 设计和制作了硅集成电感,采用常规的硅工艺,在衬底形成间隔的pn结隔离来减少硅衬底的涡流损耗。实验测量了硅集成电感的S参数并研究了衬底结隔离对硅集成电感的电感量和品质因素(Q)的影响。结果表明一定深度的衬底结隔离能有效地使电感Q值提高40%。

     

    Abstract: Integrated Inductors on silicon were designed and fabricated,and a method was applied to reduce the silicon substrate eddy currents. The method to form the p-n junction isolation in the Si substrate can be realized in standard silicon technologies without additional processing steps. S para- meters of the inductors were investigated based on equivalent circuit. Experimental results show that substrate p-n junction isolation at certain depth achieves good improvement may increase the in- ductor quality factor up to 40%.

     

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