感应耦合等离子刻蚀InP工艺

Inductively coupled plasma etching of InP

  • 摘要: 采用Cl2/CH4/N2感应耦合等离子体对InP进行了刻蚀。系统地讨论了RF功率、ICP功率、反应腔压力、气体流量等工艺参数对InP材料端面刻蚀的影响。通过优化工艺参数,获得了光滑垂直的InP刻蚀端面,刻蚀速率达到841nm/min,与SiO2的选择比达到15:1。

     

    Abstract: Inductively coupled plasma(ICP) dry etching of InP was performed using Cl2/CH4/N2.The effects of RF power,ICP power,Process pressure,the flow rate are thoroughly discussed.By adjusting etching parameters,vertical sidewall and smooth surface can be obtained.The etch rate is 841 nm/min,and the selectivity ratio over SiO2 is estimated to be higher than 15:1.

     

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