高电子迁移率晶体管太赫兹探测器特性
High-electron-mobility transistors as terahertz detectors
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摘要: 计算了外加太赫兹(THz)辐射下高电子迁移晶体管(HEMT)的导纳和探测响应率与入射THz辐射频率的依赖关系。结果表明,随着栅下沟道长度的增大,导纳和响应率的峰出现红移,同时高度有所下降;随着栅电压的增大,导纳和响应率的峰出现蓝移,并且高度有所上升。这些研究在太赫兹等离子探测器的设计上有着重要的作用。Abstract: The gate-to-source/drain admittance and the detection responsivity of the high-electron-mobility transistor(HEMT) driven by the terahertz(THz) radiation was calculated.The results indica that the peaks of the admittances and the responsivities show redshift,and the heights of the peaks decrease with the length of channel beneath the gate increasing.The peaks of the admittances and the responsivities show blueshift,and the heights of the peaks increase with the gate voltage increasing.The present analysis may be helpful to the design of THz plasma detectors.
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