一维光子晶体下拓扑绝缘体缺陷的研究

Study on topological insulator as a defect in 1-D photonic crystal

  • 摘要: 拓扑绝缘体(TI)是近年来广受关注的一种新型材料,其表面的拓扑磁电效应是其拓扑性质的反应。我们在TI平板上下表面镀上很薄的铁磁层并同方向磁化,然后将其夹在一维光子晶体中作为缺陷来研究时,发现TI材料表面的磁电耦合效应引起透射谱上一些新奇的变化。例如,当垂直入射一束线偏振光时,与一般的“单个透射率为1”的缺陷态共振峰不同,这时会出现“两个透射率为0.5”的缺陷态共振峰,并且两个透射峰频率处的透射光是圆偏振态,同时,我们还可以通过调节光子晶体的相关参数来调节这两个透射峰(双峰)的距离。反过来,我们可以通过这些新颖的变化来研究TI材料的表面性质,以及对精细结构常数进行精确测量。

     

    Abstract: Topological insulator(TI) is a new kind of material which is well concerned in recent years.The surface topological magneto-electric effect is the manifestation of its topological property.When a TI slab is plated with parallel magnetized ferromagnetic materials on both surfaces and treated as a defect in one dimensional(1-D) photonic crystal,we find a lot of new characters caused by the magneto-electric effect,such as the ’double 0.5 transmissions’ in the gap which is different from the normal defect when a linearly polarized light is normally incident,and the transmitted light can be left-and right-handed circular polarization at the double 0.5 transmissions frequencies respectively.The frequency difference between the double 0.5 peaks has been found to be modulated by different parameters of photonic crystal.From these new characters we can research the surface state of TI,as well as the fine structure constant.

     

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