Si/SiGe异质结双极晶体管的研制
Development on Si/SiGe heterojunction bipolar transistors
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摘要: 通过理论分析计算、计算机模拟和工艺实验,对Si/SiGe异质结双极晶体管(HBT)的结构参数进行了精细的优化设计,特别是采用了本征间隔层和新颖的Ge分布曲线,有效地削弱了基区杂质外扩散、基区复合和异质结势垒效应的不利影响。开发了兼容于硅工艺的锗硅HBT工艺,并据此试制出了Si/SiGe HBT,测量结果表明,器件的直流和交流特性均较好,电流放大系数为50,截止频率fT为5.1GHz。Abstract: Through computer aided simulation and processing experiment,the structure parameters of Si/SiGe HBT were optimized carefully.An intrinsic space layer and a novel Ge fraction profile are used to reduce the influence of boron outdiffusion,base recombination and HBE.A SiGe HBT process compatible with conventional Si processes is developed,by which the SiGe HBT is fabricated successfully.The results of test indicated that the current gain β is 50 and the cut-off frequency fT is 5.1 GHz.
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