考虑自热效应的AlGaN/GaN高电子迁移率晶体管建模与仿真
Model and Simulation for AlGaN/GaN HEMT including Self-heating Effect
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摘要: 基于电荷控制模型,分析了极化,载流子迁移率,饱和电子漂移速度,导带断续,掺杂浓度,沟道温度等与自然效应的关系,并考虑了寄生电阻对自热效应的影响,建立了模拟AlGaN/GaN高电子迁移率晶体管直流I-V特性的解析模型。通过与试验值的对比,该模型具有较高的精度,并且计算过程简单,可以用来指导器件结构和电路的设计。Abstract: Based on the charge control theory,a accurate analytical model of I-V characteristics for AlGaN/GaN high electron mobility transistor(HEMT) is presented considering the relationship between self-heating effect and polarization,electron mobility,velocity saturation,conduction band discontinuity,doping concentration,channel temperature.The effect of parasitic resistances is also considered.The comparison between simulations and physical calculation shows a good agreement.The model is simple in calculations,suitable for design of microwave device and circuit.
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