钙铝硼硅/氧化铝系玻璃-陶瓷致密化过程及介电性能

Densification and dielectric properties of CABS/Al2O3 system glass-ceramics

  • 摘要: 通过DSC、XRD、SEM、EDS等测试手段,研究了钙铝硼硅/氧化铝系玻璃-陶瓷一个典型组成的致密化过程,并讨论了在这过程中物相、微观结构以及介电性能的变化规律。研究结果表明:在800~900℃烧成范围内,材料先致密化后析晶;825℃时,材料已烧结致密化,介电常数达到其最大值;850℃时,玻璃中析出钙长石晶体,介电损耗大幅下降;随着温度的进一步提高,材料结构变得松散,介电损耗略有增大。1 MHz下,850℃所烧试样介电常数为7.9,介电损耗小于1×10-3,是一种性能优良的LTCC材料。

     

    Abstract: The densification process,phase shift,microstructure and dielectric properties of CABS/ Al2O3 system glass -ceramics were studied using DSC,XRD,SEM and EDS.The results show that densification has been achieved at 825℃and dielectric constant(εr) gets its maximum.At 850℃Anorthite precipitates from the matrix phase,which leads to the significant decrease of dielectric loss(tanδ).With heat -treatment temperatures increasing,tanδ increases slightly due to the loose microstructure.The obtained glass-ceramics at 850℃which have εr of 7.9 and tanδless than 1×10-3can be used as promising LTCC materials.

     

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