新型可返工环氧底部填充料的合成和性能

Synthesis and properties of novel controlled thermally degradable epoxy resin for electronic packaging

  • 摘要: 合成了两种分别含有叔酯键和叔醚键的环氧化合物EP-1和EP-2,其结构通过红外光谱、氢核磁共振谱及环氧当量测定等方法得到证实。EP-1与已有商品ERL-4221以环氧物质的量比1:1混合组成EP-3。EP-2和EP-3用酸酐类固化剂HMPA固化。TGA测试表明它们具有理想的起始热分解温度(IDT=210~220℃),显著低于现在普遍应用的环氧底部填充料ERL-4221(IDT=310℃)。它们的粘结强度和玻璃化转变温度Tg在返工温度(225℃)老化数分钟后迅速降低,可以满足当前微电子倒装芯片封装对可返修工艺的要求。

     

    Abstract: The synthesis,formulation and characterizations of two new diepoxides were reported,one diepoxide contains tertiary ester(EP-1) and the other contains tertiary ether linkages(EP-2).Both compounds were characterized with 1H-NMR and FT-IR and formulated into underfill materials with an anhydride as hardener and a 2-methylimidazole as catalyst.A dual-epoxy system(EP-3) was also formulated with the tertiary ester diepoxide and a conventional aliphatic diepoxide,ERL-4221,using the same hardener and catalyst.The thermogravimetric analysis(TGA) reveals that the cured EP-2 and EP-3 had obviously lower thermal decomposition onset temperature(around 215℃) than ERL-4221(310℃).The shear strength and glass transition temperatures of these novel diepoxides decreas quickly upon being aged at 225℃.The unusual thermal degradable properties make these compounds a potential use as reworkable underfill for flip-chip application.

     

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