反应离子刻蚀工艺仿真模型的研究

Modeling and simulation of reactive ion etching technology

  • 摘要: 以SF6/N2混合气体对Si反应离子刻蚀工艺研究为例提出干法刻蚀计算机工艺模拟的方法 :在分段拟合优化工艺条件下采用人工神经网络方法建立干法刻蚀仿真模型, 可以予测给定射频功率、总气流量下刻蚀速率和纵横比, 并且以仿真实验数据训练模型学习, 模型具有通用性, 与设备无关。

     

    Abstract: In this work, we report a simulation method of RIE technology based on RIE of silicon using SF6/N2 mixture gases. Our approach consists of the following elements:(a) fitting and optimization in parts.(b)modeling by artificial neural network. The system of RIE simulation can be used to predict the etching rate and the aspect ratio. Also the modeling can be used for general purpose and is independent on etching equipment.

     

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