MEMS微悬臂梁在冲击环境下的可靠性

Reliability for MEMS micro-cantilevers under shock load

  • 摘要: 由于MEMS器件的可靠性成为MEMS产品商业化过程中一个重要问题,而冲击断裂是导致器件失效的一个重要原因。本文主要研究多晶硅微悬臂梁在冲击条件下的可靠性,文中阐述了断裂失效机理,并使用应力-强度模型对可靠度进行建模。通过实验统计在各种加速度冲击下的可靠度,并将实验实测值与理论值进行对比。

     

    Abstract: The reliability of MEMS is a key problem for its commercial application.Fracture is a important factor for the failure.In this paper,we mainly focus on fracture Reliability for poly-silicon micro-cantilevers under shock load,expatiate on the failure mechanism of Fracture,and build a model using stress-strength principle.A lot of data will be collected after the shock experiment.Then the comparison between the experimental curve and the theoretic curve would be presented.

     

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