片式多层陶瓷电容的可靠性应用研究

Application research on the reliability of chip multilayer ceramic capacitors

  • 摘要: 作为一种新兴基础电子元件,片式多层陶瓷电容因其优良性能,在电路设计中得到了广泛的应用;首先,文中分析了片式多层陶瓷电容结构及材料特性,深入阐述了其常见应用失效模式;然后,基于对片式多层陶瓷电容的机械应力失效分析与研究,结合实验数据,提出了可行的设计方法,经工程实践验证,可有效提升片式多层陶瓷电容的应用可靠性。

     

    Abstract: As a new basic electronic components,chip multi-layer ceramic capacitors because of its excellent performance in the circuit design has been widely used; Fristly,this paper analyzes the structure and the material properties of chip multi-layer ceramic capacitors,and expounds deeply common application failure mode; Then,based on the chip multilayer ceramic capacitor failure analysis and study of mechanical stress,combined with the experimental data,the corresponding design method is proposed,The design method has been proven by engineering practice: effectively increasing the chip multi-layer ceramic capacitors application reliability.

     

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