非对称型门极换流晶闸管模拟

Simulation of asymmetric gate commutate thyristor

  • 摘要: 建立了非对称型门极换流晶闸管器件模型,对其进行了工艺模拟和器件模拟。模拟结果表明,缓冲层与透明阳极各自区域中的杂质总量是决定GCT的通态压降的关键因素。通过协调各自区域的峰值掺杂浓度与厚度,可以合理地控制该区域的杂质总量,降低GCT的通态压降。n基区的寿命变化对器件的通态压降影响十分明显,辐照剂量的选取要折衷关断时间和通态压降的要求。

     

    Abstract: An asymmetric gate commutation thyristor model was set up and process and device simulations were done.Simulation results show that the total amount of impurity in the buffer layer or transparent anode is the key to determine the on-state voltage drop of GCT device.The on-state voltage can be reduced by modifying the thickness and doping profile of each layer to control the total amount of impurity. In addition,the influence of the minority carrier lifetime of n-base region on the on-state voltage of GCT device is obviously observed.The dose of electron irradiation is selected with the tradeoff between the turn-off time and on-state voltage of GCT device.

     

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