Abstract:
WO
3 thin film based on Si-NPA(WO
3/Si-NPA) was prepared by sol-gel method and spin-coating technique.The characterization of surface morphology and structure by filed-emission scanning electron microscope and X-ray diffractometer indicated that the surface of Si-NPA was well covered by a continuous layer of WO
3 thin film.By evaporating coplanar interdigital aluminum electrodes on WO
3/Si-NPA,a capacitive humidity sensor was fabricated,and humidity properties of the sensors with different thickness of WO
3 thin film were tested.It was shown that with the relative humidity(RH) changed from 11% to 95%,the capacitance of the sensor is very large and decreased with increasing testing frequency.The sensitivity of the device is strongly dependent on the thickness of WO
3 thin film,which increased sharply with increasing the thickness of WO
3 thin film,but the corresponding response time and recover time were prolonged.