Abstract: The low emissivity glass is coated with a layer of transparent conductive oxide film on the surface of the slope glass, which has a good transmittance in the visible light band, ensures the demand for lighting, and has a strong reflectivity in the middle and far infrared bands. In this paper, a low emissivity glass sample radiation characteristic test device with simple structure, low cost and short test cycle is designed and implemented, which can simply and quickly judge the quanlity of the sample and accelerate the development process. The radiation characteristics of the prepared SnO₂:Sb thin film glass samples were analyzed, which basically met the performance requirements of low radiation glass. The experimental results show that the temperature in the dewar of the ordinary glass window increases from 21.5 ℃ to 45.7 ℃, while the temperature in the dewar of the SnO₂:Sb film glass window increases from 21.5 ℃ to 43.3 ℃, which is 2.4 ℃ lower than the temperature in the dewar of the ordinary glass window after 3 hours of light source irradiation. In the natural cooling stage, the dewar bottle with a higher temperature ordinary glass window drops to the room temperature faster. Relevant tests show that the device has certain usability, practicality and popularization.